Sign In | Join Free | My chinaqualitycrafts.com |
|
Brand Name : ZMKJ
Model Number : 2inch AlN-sapphire
Place of Origin : China
MOQ : 5pcs
Price : by case
Payment Terms : T/T, Western Union, paypal
Supply Ability : 50pcs/month
Delivery Time : in 30days
Packaging Details : single wafer container in cleaning room
substrate : sapphire wafer
layer : AlN template
layer thickness : 1-5um
conductivity type : N/P
Orientation : 0001
application : high power/high frequency electronic devices
application 2 : 5G saw/BAW Devices
silicon thickness : 525um/625um/725um
2inch 4iinch 6Inch Sapphire based AlN templates AlN film on sapphire substrate sapphire window sapphire wafer
Other relaterd 4INCH GaN Template Specification
GaN/ Al₂O₃ Substrates (4") 4inch | |||
Item | Un-doped | N-type | High-doped N-type |
Size (mm) | Φ100.0±0.5 (4") | ||
Substrate Structure | GaN on Sapphire(0001) | ||
SurfaceFinished | (Standard: SSP Option: DSP) | ||
Thickness (μm) | 4.5±0.5; 20±2;Customized | ||
Conduction Type | Un-doped | N-type | High-doped N-type |
Resistivity (Ω·cm)(300K) | ≤0.5 | ≤0.05 | ≤0.01 |
GaN Thickness Uniformity | ≤±10% (4") | ||
Dislocation Density (cm-2) | ≤5×108 | ||
Useable Surface Area | >90% | ||
Package | Packaged in a class 100 clean room environment. |
Crystal structure | Wurtzite |
Lattice constant (Å) | a=3.112, c=4.982 |
Conduction band type | Direct bandgap |
Density (g/cm3) | 3.23 |
Surface microhardness (Knoop test) | 800 |
Melting point (℃) | 2750 (10-100 bar in N2) |
Thermal conductivity (W/m·K) | 320 |
Band gap energy (eV) | 6.28 |
Electron mobility (V·s/cm2) | 1100 |
Electric breakdown field (MV/cm) | 11.7 |
![]() |
6 Inch Sapphire Based AlN Templates Wafer For 5G BAW Devices Sapphire wafer sapphire window Images |